- All sections
- G - Physics
- G06F - Electric digital data processing
- G06F 30/333 - Design for testability [DFT], e.g. scan chain or built-in self-test [BIST]
Patent holdings for IPC class G06F 30/333
Total number of patents in this class: 171
10-year publication summary
|
0
|
0
|
6
|
7
|
15
|
29
|
34
|
43
|
28
|
7
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Synopsys, Inc. | 2829 |
17 |
| Cadence Design Systems, Inc. | 1788 |
16 |
| International Business Machines Corporation | 60644 |
13 |
| Microsoft Technology Licensing, LLC | 51439 |
11 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
10 |
| Siemens Industry Software Inc. | 1633 |
10 |
| Xilinx, Inc. | 4086 |
8 |
| SiFive, Inc. | 117 |
6 |
| Samsung Electronics Co., Ltd. | 131630 |
4 |
| Intel Corporation | 45621 |
3 |
| University of Florida Research Foundation, Inc. | 3883 |
3 |
| Banner Engineering Corporation | 179 |
3 |
| Tektronix, Inc. | 636 |
3 |
| Qualcomm Incorporated | 76576 |
2 |
| Toshiba Corporation | 12017 |
2 |
| Texas Instruments Incorporated | 19376 |
2 |
| Realtek Semiconductor Corp. | 3028 |
2 |
| JPMorgan Chase Bank, National Association | 10964 |
2 |
| Bqr Reliability Engineering Ltd. | 9 |
2 |
| Imagination Technologies Limited | 1458 |
2 |
| Other owners | 50 |